Question

Which device below translates changes in the oscillation of a beam (or cantilever) as its tip

encounters variations in a specimen's topography into a 3-dimensional topographic image of the
specimen's surface?
1) scanning electron microscopy
2) SEM
3) atomic force microscopy
4) transmission electron microscopy
A) 1
B) 2
C) 3
D) 4
E) 1 and 2

Answer 1

The correct answer is atomic force microscopy (AFM), which uses a sharp tip on a cantilever to measure surface variations and create a 3D topographic image.

Step-by-step explanation:

The device that translates changes in the oscillation of a beam or cantilever as its tip encounters variations in a specimen's topography into a 3-dimensional topographic image of the specimen's surface is known as atomic force microscopy (AFM).

Unlike scanning electron microscopy (SEM), which provides images using secondary electrons produced by the primary beam interacting with the surface of the sample and focuses the beam onto the sample to scan in x and y directions, AFM uses a cantilever with a sharp tip that scans the surface of the specimen. The tip's interaction with the surface is measured, and a 3-dimensional image is created to represent the topography of the sample's surface.