Final answer:
The two types of Electron Microscopy (EM) are Transmission Electron Microscope (TEM), which provides detailed internal views by passing electrons through a specimen, and Scanning Electron Microscope (SEM), which scans a specimen's surface for surface detail imaging.
Step-by-step explanation:
The two types of Electron Microscopy (EM) are the Transmission Electron Microscope (TEM) and the Scanning Electron Microscope (SEM). The TEM operates similarly to a brightfield light microscope but uses an electron beam focused by a magnetic lens to project through a specimen onto a detector. This allows electrons to pass through the specimen, and the resulting image is captured by the detector, providing detailed internal structural views. The SEM, on the other hand, scans the surface of a specimen with a focused electron beam, which reflects off the surface to create an image. This technique is particularly useful for examining the texture and topography of a specimen's surface.