Question

Which of the followings is false about scanning electron microscopy?

A) Images are made from secondary electrons are generated within the depth range of about 10 nm below the specimen surface.
B) Specimens should be coated with conducting material and grounded.
C) The objective lens of an scanning electron microscope collects electrons for the detector
D) Scanning electron microscopy visualizes surface features.
E) Scanning electron microscopy can bring objects located in varying distances, allowing acquisition of stereoscopic images.

Answer 1

Scanning electron microscopy (SEM) involves the use of secondary electrons produced by the primary beam interacting with the specimen surface to create images. Specimens must be coated with conducting material and grounded. The objective lens of an SEM does not collect electrons for the detector, but focuses the primary electron beam onto the specimen surface.

Step-by-step explanation:

In scanning electron microscopy (SEM), images are made from secondary electrons that are generated within the depth range of about 10 nm below the specimen surface.

Specimens should be coated with a conducting material and grounded to ensure conductivity. The objective lens of a scanning electron microscope does not collect electrons for the detector; it focuses the primary electron beam onto the specimen surface for imaging.

Scanning electron microscopy visualizes surface features and does not provide a view of internal structures like transmission electron microscopy (TEM). Scanning electron microscopy can bring objects located in varying distances, allowing the acquisition of stereoscopic images.