Question

What type of microscope operates by scanning a sharp, nanosized tip (or probe), which, in

one version of the microscope, is associated with a tiny movable beam or cantilever, over the surface of
the specimen being observed?
1) scanning electron microscopy
2) SEM
3) atomic force microscopy
4) transmission electron microscopy
A) 1
B) 2
C) 3
D) 4
E) 1 and 2

Answer 1

The microscope that scans with a nanosized tip over a specimen is the (3) atomic force microscope (AFM), which is a type of scanning probe microscopy that allows for high-resolution, three-dimensional imaging at the nanoscale.

Step-by-step explanation:

The type of microscope described in the question is the atomic force microscope (AFM). Unlike electron microscopy (EM), which includes the transmission electron microscope (TEM) and scanning electron microscope (SEM), AFM falls into the category of scanning probe microscopy. Rather than using electrons, the AFM operates by scanning a sharp, nanosized tip over the surface of the specimen.



This is done by using a tiny movable beam or cantilever that interacts with the surface to produce high-resolution, three-dimensional images of the specimen. With its capability to measure feedback from sharp probes interacting with the specimen, AFM can achieve magnifications high enough to observe individual atoms on surfaces, making it an invaluable tool for nanoscale imaging.