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Radiation type visible light beams of electrons magnification typically up to x1000 approx x100,000 in sem approx x250,000 in tem radiation focused by lenses - usually glass lenses electromagnets resolution 200 nm 0.5 nm cells

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Electron microscopy uses electron beams for imaging, achieving greater magnification and resolution than light microscopes by using the shorter wavelengths of electrons. TEM and SEM are two types of electron microscopes offering different magnifications and capabilities in visualizing samples.

Step-by-step explanation:

Electron microscopy utilizes electron beams to achieve high levels of magnification and resolution. Unlike light microscopes that use visible light and are limited to a magnification of approximately 1,000 to 1,500 times, electron microscopes can magnify objects to a much greater extent. The shorter wavelength of electrons, at 0.005 nm, allows them to resolve features as small as 0.1 nm (10-10 m) in the case of transmission electron microscopes (TEM), greatly exceeding the resolution of optical microscopes. Two main types of electron microscopes are the TEM and the scanning electron microscope (SEM). TEM passes electrons, which are focused by electromagnetic lenses, through a thin sample and can magnify up to 100 million times, whereas SEM scans a beam of electrons over the surface of a specimen and provides detailed surface images at magnifications of up to 500,000 times. Developments in electron microscopy have even made it possible to observe individual atoms and study the detailed structure of cellular components. However, samples for TEM must be very thin and often require special preparation, including being placed in a vacuum and 'fixed' for observation.

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