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A TiW layer is deposited on a substrate using a sputtering tool. The table contains layer thickness measurements (in angstroms) on 20 subgroups of four substrates.

Option a: Not applicable for multiple-choice options.
Option b: Not applicable for multiple-choice options.
Option c: Not applicable for multiple-choice options.
Option d: Not applicable for multiple-choice options.

User Eldan
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Final answer:

The discussion concerns the engineering concepts of thin film deposition and interference, requiring understanding of material science, quantum mechanics, and optics.

Step-by-step explanation:

The question relates to the deposition of thin films in an engineering context, specifically using a sputtering tool for a TiW layer and the concept of thin film interference. In the examples given, different aspects such as time required for deposition, calculation of tunneling probability, and interference resulting from thin films are discussed. These illustrate practical applications of physics and engineering principles to material science and surface engineering problems.

To calculate the time required for chromium deposition, one would need Faraday's laws of electrolysis. To estimate tunneling probability, quantum mechanical concepts and equations such as transmission coefficient are employed, while thin film interference involves optical path differences and phase changes upon reflection.

User Aminata
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